Searched refs:si_test (Results 1 – 1 of 1) sorted by relevance
421 i++; si_test[i].num = 0x07F0; si_test[i].expected = "2032"; in test_signed_int_formatting()422 i++; si_test[i].num = 0x007F; si_test[i].expected = "127"; in test_signed_int_formatting()425 i++; si_test[i].num = 0x0700; si_test[i].expected = "1792"; in test_signed_int_formatting()426 i++; si_test[i].num = 0x0070; si_test[i].expected = "112"; in test_signed_int_formatting()427 i++; si_test[i].num = 0x0007; si_test[i].expected = "7"; in test_signed_int_formatting()430 i++; si_test[i].num = 0x0500; si_test[i].expected = "1280"; in test_signed_int_formatting()431 i++; si_test[i].num = 0x0050; si_test[i].expected = "80"; in test_signed_int_formatting()432 i++; si_test[i].num = 0x0005; si_test[i].expected = "5"; in test_signed_int_formatting()434 i++; si_test[i].num = 0x0001; si_test[i].expected = "1"; in test_signed_int_formatting()435 i++; si_test[i].num = 0x0000; si_test[i].expected = "0"; in test_signed_int_formatting()[all …]
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